Blog

SQ3000™ – Industry-Leading Inspection & Measurement System for AOI, SPI and CMM at NEPCON Korea

CyberOptics® will exhibit at NEPCON Korea, scheduled to take place May 15-17, 2019 at the COEX in Seoul. The company will demonstrate the MRS-Enabled 3D SQ3000™ with multi-process capabilities including 3D Automated Optical Inspection (AOI)3D Solder Paste Inspection (SPI) and Coordinate Measurements (CMM) in Booth #K112.

The 3D SQ3000 all-in-one system can identify critical defects and measure critical parameters, providing a superior process control solution for effective yield management. In addition to AOI and SPI applications, highly accurate coordinate measurements can be attained faster than a traditional Coordinate Measurement Machine (CMM) – in seconds, not hours. The world’s first in-line CMM includes an extensive software suite for metrology grade measurement on all critical points.

Powered by proprietary MRS sensor technology, the SQ3000 offers unmatched accuracy by meticulously identifying and rejecting reflections caused by shiny components making MRS an ideal technology solution for a wide range of applications with stringent requirements. The Ultra-High Resolution MRS sensor option delivers superior performance ideally suited for socket metrology, microelectronics and other applications where an even greater degree of accuracy and inspection reliability is critical.