Nordson Test & Inspection’s Chris Rand Explains Approaches to Achieving Zero Defects in Microelectronics Devices Using X-Ray Inspection

Dive deep into the world of X-ray inspection and its many uses in today’s high-density 3D heterogeneous integration technologies for semiconductor manufacturing. Françoise von Trapp speaks with subject matter expert, Chris Rand, of Nordson Test and Inspection.

Learn why achieving zero defects is so important for today’s semiconductor and microelectronics devices and the different strategies for achieving zero defects