The QX600™ is designed with SIM Technology (Strobed Inspection Module) with enhanced illumination – delivering the best 01005 and solder joint inspection performance ever.
With a higher sensor resolution (12 µm), you get to see crisp, perfect quality images for more accurate defect review.
‘On-the-Fly’ High Performance
Fast, Smart, Easy-to-use software
The SIM (Strobed Inspection Module) is at the core of every CyberOptics’ 2D AOI system. Designed and manufactured exclusively by CyberOptics, the SIM delivers high performance inspection at 200cm2/sec – And, it is absolutely calibration-free.
QX600 is equipped with SAM (Statistical Appearance Modeling) vision technology to give you the power to inspect ‘anything’ while keeping programming extremely simple – no algorithms to tune or parameters to adjust. SAM works in perfect harmony with AI² (Autonomous Image Interpretation) technology to enable fast programming and reliable discrimination against defects.
From pre-reflow inspection to post wave and post selective solder inspection, the QX250i provides crisp images for more accurate defect review.
Inspect and check for defects including coplanarity, missing pins/ components, insufficient solder, solder bridge and many more.
50 x 308 mm
50 x 590 mm
50 x 457 mm
50 x 510 mm
12µm pixel size