The QX250i™ AOI system offers fast, flexible and high performance inspection for all applications and is ideally suited for pre-reflow and selective solder inspection. The top and bottom high-resolution Strobed Inspection Modules (SIMs) with enhanced illumination provide a single platform for the inspection and defect review process that shortens the production line and drives ~50% productivity improvement.
‘On-the-Fly’ High Performance
Fast, Smart, Easy-to-use software
The SIM (Strobed Inspection Module) is at the core of every CyberOptics’ 2D AOI system. Designed and manufactured exclusively by CyberOptics, the SIM delivers high performance inspection at 200cm2/sec – And, it is absolutely calibration-free.
AI² (Autonomous Image Interpretation) technology in the QX250i ensures ultrafast programming and is capable of getting you from zero to production ready in less than 13 minutes*. Powered by an 80-megapixel sensor, QX250i™ significantly improves solder joint and 01005 inspection performance.
From pre-reflow inspection to post wave and post selective solder inspection, the QX250i provides crisp images for more accurate defect review.
Inspect and check for defects including coplanarity, missing pins/ components, insufficient solder, solder bridge and many more.
Min. 50 mm (2 in.)/ Max. 308 mm (12 in.)
Min. 50 mm (2 in.)/ Max. 405 mm (16 in.)
12µm pixel size (17µm for QX200i)