CyberCMM™, a comprehensive software suite of coordinate measurement tools provides highly accurate, 100% metrology-grade measurement on all critical points much faster than a traditional CMM, including coplanarity, distance, height and datum X, Y to name a few. A fast and easy set-up can be performed in less than an hour for programming complex applications as compared to slow, engineering resource-intensive set-up that typically requires multiple adjustments with traditional coordinate measurement machines (CMMs).
Simplifies process with award-winning, intuitive, touch screen experience. Quick programming for complex applications. Multi-process capable – AOI, SPI, AOM, CMM.
Achieve metrology-grade accuracy with MRS-enabled technology. Repeatable and reproducible measurements for metrology, semiconductor, microelectronics and SMT applications.