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Significantly speeds attaining coordinate measurements vs. traditional CMMs. Reduces engineering resource time.

CyberCMM™, a comprehensive software suite of coordinate measurement tools provides highly accurate, 100% metrology-grade measurement on all critical points much faster than a traditional CMM, including coplanarity, distance, height and datum X, Y to name a few. A fast and easy set-up can be performed in less than an hour for programming complex applications as compared to slow, engineering resource-intensive set-up that typically requires multiple adjustments with traditional coordinate measurement machines (CMMs).

Easy-to-use Interface
Simplifies process with award-winning, intuitive, touch screen experience. Quick programming for complex applications. Multi-process capable – AOI, SPI, AOM, CMM.

Metrology-grade Accuracy
Achieve metrology-grade accuracy with MRS-enabled technology. Repeatable and reproducible measurements for metrology, semiconductor, microelectronics and SMT applications.



  • Line / Distance / X,Y / Mid Line
  • Inter Point / Regression Shifted
  • Datum X,Y / LSF X,Y Offset
  • X,Y Offset / Value / Location / List of X,Y Values
  • Height / Local Height / Regression / Radius
  • Coplanarity / Distance to plane / 2nd Order fitting
  • Difference / Absolute / 2sqrt / VC
  • Max / Min / Ave / Sigma / Plus / Minus / Multiply