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For Improved Yields and Process Control.

Improve your inspection and metrology processes with CyberOptics’ unparalleled portfolio of systems – The Ultimate combination of Speed, Resolution and Accuracy.

When you need the best combination of speed, resolution, accuracy and ease-of-use for inspection and metrology for wafer-level and advanced packaging, count on CyberOptics for premier process control solutions. CyberOptics systems can find critical defects and measure critical parameters, in order to fix what can be found and control what can be measured – the ultimate solution, particularly for the most challenging applications.

The WX3000™ system offers a combination of unmatched accuracy and speed with the industry-leading Multi-Reflection Suppression™ (MRS™) sensor technology that meticulously identifies and rejects reflections caused by shiny components and surfaces. Effective suppression of multiple reflections is critical for highly accurate measurement, making the proprietary MRS technology an ideal solution for a wide range of applications with exacting requirements.

 

Save Time & Expense

  • Improve yields, uptime and throughput
  • Improve Quality
  • Improve process control and operational efficiencies
  • Establish repeatable and verifiable standards
  • Reduce training time and resource needs
  • Reduce rework costs
Powered by MRS™ Technology

WX3000™ Metrology and Inspection Systems for Wafer-Level and Advanced Packaging

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Powered by MRS Technology

NanoResolution MRS™ Sensor

NanoResolution MRS Sensor for Wafer-Level and Advanced Packaging Applications for OEM integration.

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The Ultimate in Speed and Accuracy for Coordinate Measurement Applications - Seconds. Not Hours

SQ3000 CMM for Semiconductor Applications

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