Connect with CyberOptics’ SQ3000™ Multi-Function System on the ONLINE CONFERENCE & EXPO
Minneapolis, Minnesota — July 2020 — CyberOptics® Corporation (NASDAQ: CYBE), a leading global developer and manufacturer of high-precision 3D sensing technology solutions, will highlight its SQ3000™ Multi-Function for AOI, SPI and CMM during the ONLINE CONFERENCE & EXPO. The event will be broadcasted live on Wednesday, July 8, 2020 from 10 a.m. – 2:30 p.m. EST, showing new products from eight exhibitors.
CyberOptics will feature the 3D SQ3000 multi-function system that can identify critical defects and measure critical parameters, providing a superior process control solution for effective yield management.
In addition to AOI and SPI applications, highly accurate coordinate measurements can be attained faster than a traditional Coordinate Measurement Machine (CMM) – in seconds, not hours.
The world’s first in-line CMM includes an extensive software suite for metrology grade measurements on all critical points. In addition, the latest 3D AOI software enables ultra-fast programming capabilities, auto tuning and enhancements that significantly speed setup, simplify the process, reduce training efforts and minimize operator interaction.
Powered by proprietary Multi-Reflection Suppression™ (MRS™) sensor technology, the 3D SQ3000 all-in-one system offers an unmatched combination of high speed, high resolution and high accuracy. The MRS sensor meticulously identifies and rejects reflections caused by shiny components making it an ideal technology solution for a wide range of applications with stringent requirements. The Ultra-High Resolution MRS sensor option delivers superior performance ideally suited for socket metrology, microelectronics and other applications where an even greater degree of accuracy and inspection reliability is critical.
Sponsored by Global SMT & Packaging, the ONLINE CONFERENCE & EXPO will feature the latest technical presentations, video booth interviews and special guest appearances. To learn more or to register as a visitor, visit the ONLINE CONFERENCE & EXPO registration page.