Our products significantly improve yields and productivity in the SMT and semiconductor markets.

High-Precision sensors and systems for
AOI, SPI and Metrology.


Unparalleled combination of
High Resolution, High Accuracy and High Speed.

Inspection and Measurement Systems for SMT, Semi and Other Applications

As the recognized leader for quality inspection systems, CyberOptics offers AOI, SPI, FVI and CMM solutions that come with the assurance of high quality, accuracy and speed. Plus, unique value-add solutions designed with a unified purpose – better process, better yield.

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Wireless Measurement Sensors

Speed your semiconductor processes with WaferSense® and ReticleSense® sensors. They are the most efficient and effective wireless measurement devices that improve yields and tool-uptime.

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3D Scanning Inspection Systems and Scanning Services

Standard of excellence in 3D scanning and measurement.

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We’re Revolutionizing 3D Sensing Solutions For Inspection and Metrology

CyberOptics pioneering sensor technology provides our customers with a means to grow and strengthen their competitive positions as the demands for higher accuracy at faster production speeds increase.

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Upcoming Events

SPIE Optics+Photonics 2021

August 1, 2021
Alignment and Engineering Applications Session
2:30-2:50PM PDT

NEPCON Asia 2021

August 25-27, 2021

Shenzhen, China

Booth 1J45

Shenzhen Convention & Exhibition Center

Productronica India 2021

September 22-24, 2021

Bengaluru, India

Bangalore International Exhibition Centre (BIEC)

SPIE Photomask Technology and EUV Lithography 2021

September 26-30, 2021

Monterey, California, USA

Monterey Conference Center

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