Our products significantly improve yields and productivity in the SMT and semiconductor capital equipment markets.

High-Precision sensors and systems for
AOI, SPI and Metrology.


Unparalleled combination of
High Resolution, High Accuracy and High Speed.

Inspection and Measurement Systems

As the recognized leader for quality inspection systems, CyberOptics offers AOI, SPI, and CMM solutions that come with the assurance of high quality, accuracy and speed. Plus, unique value-add solutions designed with a unified purpose – better process, better yield.

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Speed Your Semiconductor Processes

WaferSense® & ReticleSense® Wireless Measurement Devices. They are the most efficient and effective wireless measurement devices to speed semiconductor processes — and they improve yield and tool up-time.

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3D Scanning Inspection

Standard of excellence in 3D scanning and measurement.

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We’re Revolutionizing 3D Sensing Solutions For Inspection and Metrology

CyberOptics pioneering sensor technology provides our customers with a means to grow and strengthen their competitive positions as the demands for higher accuracy at faster production speeds increase.

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Upcoming Events

SPIE Photomask Technology + EUV Lithography

September 17-18, 2019

Monterey, California

Booth# 307

Monterey Conference Center and Monterey Marriott

Semicon Taiwan

September 18-20, 2019


Booth# L0310 – 4th Floor

Taipei Nangang Exhibition Center


September 25-26, 2019

Birmingham, UK

Booth F68

NEC Birmingham

Productronica India

September 25-27, 2019

New Delhi

Hall 15 – Booth PE01

Greater Noida Expo Centre

View All Events