Our products significantly improve yields and productivity in the SMT and semiconductor capital equipment markets.

High-Precision sensors and systems for
AOI, SPI and Metrology.


Unparalleled combination of
High Resolution, High Accuracy and High Speed.

Inspection and Measurement Systems

As the recognized leader for quality inspection systems, CyberOptics offers AOI, SPI, and CMM solutions that come with the assurance of high quality, accuracy and speed. Plus, unique value-add solutions designed with a unified purpose – better process, better yield.

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Speed Your Semiconductor Processes

WaferSense® & ReticleSense® Wireless Measurement Devices. They are the most efficient and effective wireless measurement devices to speed semiconductor processes — and they improve yield and tool up-time.

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3D Scanning Inspection

Standard of excellence in 3D scanning and measurement.

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We’re Revolutionizing 3D Sensing Solutions For Inspection and Metrology

CyberOptics pioneering sensor technology provides our customers with a means to grow and strengthen their competitive positions as the demands for higher accuracy at faster production speeds increase.

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Upcoming Events

Southern Manufacturing and Electronics

February 11-13, 2020

Farnborough, Hampshire, UK

Booth #L75

Farnborough International

SPIE Advanced Lithography

February 25-26, 2020

San Jose, California, USA

Booth #308

San Jose Convention Center

SMART SMT & PCB Assembly

March 4-6, 2020

Seoul, South Korea

Suwon Convention Center

Photomask Japan

April 19-21, 2020

Yokohama, Japan

Annex Hall

Pacifico Yokohama

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