Our products significantly improve yields and productivity in the SMT and semiconductor capital equipment markets.

High-Precision sensors and systems for
AOI, SPI and Metrology.


Unparalleled combination of
High Resolution, High Accuracy and High Speed.

Inspection and Measurement Systems

As the recognized leader for quality inspection systems, CyberOptics offers AOI, SPI, and CMM solutions that come with the assurance of high quality, accuracy and speed. Plus, unique value-add solutions designed with a unified purpose – better process, better yield.

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Speed Your Semiconductor Processes

WaferSense® & ReticleSense® Wireless Measurement Devices. They are the most efficient and effective wireless measurement devices to speed semiconductor processes — and they improve yield and tool up-time.

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3D Scanning Inspection

Standard of excellence in 3D scanning and measurement.

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We’re Revolutionizing 3D Sensing Solutions For Inspection and Metrology

CyberOptics pioneering sensor technology provides our customers with a means to grow and strengthen their competitive positions as the demands for higher accuracy at faster production speeds increase.

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Upcoming Events

Productronica Germany

November 12-15, 2019

Munich, Germany

Hall A2 Booth 439

Messe Munchen

Semicon Europa

November 12-15, 2019

Munich, Germany

Booth# B1101

Messe Munchen

Semicon Japan

December 4-6, 2019

Chiba, Japan

Makuhari Messe

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