See you at Nepcon Japan

Tokyo Big Sight, January 17-19th in booth E1-39.

See how MRS-Enabled Inspection & Measurement Systems can Improve Your Yields.

What can you expect at Nepcon Japan?

A Leap Forward in Solder Paste Inspection. Vaulting to a new level of Precision.

The new SE3000™ SPI system is the very first SPI system to incorporate the industry-leading MRS sensor technology with a finer resolution for the best accuracy, repeatability and reproducibility – even on the smallest paste deposits. Combined with the award-winning, easy-to-use software, solder paste inspection has reached a new level of precision for the most stringent requirements.

Maximum Flexibility – Just as Accurate. Twice as Fast.

The new SQ3000-DD 3D AOI dual lane, dual Multi-Reflection Suppression (MRS) sensor system maximizes flexibility catering to varying PCB widths. This unique design provides the ability to inspect high volume assemblies, the convenience of inspecting different assemblies and board sizes simultaneously on different lanes, or even switching from dual lane to single lane mode to inspect very large boards.

Not only does the SQ3000-DD provide the PCB inspection flexibility, it also provides the flexibility to choose two of the same or two different proprietary MRS sensors, both of which meticulously identify and reject multiple reflections caused by shiny components and reflective solder joints.

The new Ultra-High Resolution MRS sensor option provides an even finer resolution than the standard, delivering superior inspection performance ideally suited for 0201 metric and microelectronics applications where an even greater degree of accuracy and inspection reliability is critical. The unique architecture of both MRS sensor options simultaneously captures and transmits multiple images in parallel, while highly sophisticated 3D fusing algorithms merge the images together, delivering microscopic image quality at production speed.

Metrology-Grade Coordinate Measurements in Seconds, Not Hours.

The new SQ3000 3D CMM (Coordinate Measurement) system, powered by Multi-Reflection Suppression (MRS) technology utilizes CyberCMM™, a new comprehensive software suite for coordinate measurement. In a lab or production environment, the MRS-enabled SQ3000 CMM system is extremely fast and highly accurate, with repeatable and reproducible measurements for metrology applications in manufacturing of a wide variety of products such as PCBs, semiconductors and consumer electronics.

CyberCMM™, an extensive suite of CMM tools, provides 100 percent metrology-grade measurement on all critical points much faster than a traditional CMM, including coplanarity, distance, height and datum X, Y, to name a few. A fast and easy setup can be performed as compared to a slow, engineering resource-intensive setup that typically requires multiple adjustments with traditional CMMs.