When you need the best combination of speed, resolution, accuracy and ease-of-use for inspection and metrology for singulated memory modules, count on CyberOptics for premier process control solutions. CyberOptics systems can find critical defects and measure critical parameters, in order to fix what can be found and control what can be measured – the ultimate solution, particularly for the most challenging applications.
The MX3000™ system offers a combination of unmatched accuracy and speed with the industry-leading Multi-Reflection Suppression® (MRS®) sensor technology that meticulously identifies and rejects reflections caused by shiny components and surfaces. Effective suppression of multiple reflections is critical for highly accurate measurement, making the proprietary MRS technology an ideal solution for a wide range of applications with exacting requirements.
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