Press Releases

CyberOptics to Present Yield-Improving Measurement Methods for Semiconductor Fabs at Photomask Japan

CyberOptics will present two technical posters reviewing yield-improving measurement methods for Airborne Particles and Relative Humidity (RH) in semiconductor fabs at the Photomask Japan show, April 5-7 at the Pacifico in Yokohama, Japan. The session will take place on Thursday, April 6 from 16:20 – 17:50.