CyberOptics Receives Mexico Technology Award for Dual-Mode MRS® sensor-enabled SE3000™ SPI System
29th Award Win for Proprietary MRS Sensor Technology

The new Dual-Mode MRS sensor for the SE3000™ SPI system provides maximum flexibility for dedicated solder paste inspection applications, with one mode for high-speed inspection and another mode for high resolution inspection. The new sensor is an extension of the proprietary MRS sensor portfolio that provides industry-leading performance in semiconductor and SMT markets. The SE3000 is ideal for measuring height, area, volume, registration and bridging, as well as detecting insufficient paste, excess height, smear, offset and more.
“We’re delighted to receive our 29th award related to our MRS sensor technology,” said Dr. Subodh Kulkarni, President and CEO, CyberOptics Corporation. “Our customers value the superior performance and the flexibility to switch modes to high-resolution or high-speed depending on their SPI application needs. We’re providing yet another MRS sensor solution that improves our customers’ yields and processes.”
MRS sensor technology provides the ultimate combination of speed, resolution and accuracy while meticulously identifying and rejecting reflection-based distortions caused by shiny components and surfaces.
The Mexico Technology Awards acknowledge the latest innovations available in Mexico produced by OEM manufacturing equipment and materials suppliers during the last 12 months. For more information, visit www.mexicoems.com/mta-awards.







